Journal: Materials

Article Title: Deformation Texture of Bulk Cementite Investigated by Neutron Diffraction

doi: 10.3390/ma15134485

Figure Lengend Snippet: Typical neutron diffraction patterns obtained in the as-sintered sample. The blue lines in the left portion of the figure shows the expected peak positions of cementite. Each solid line in the right portion of the figure is the result of peak fitting.

Article Snippet: The bulk cementite samples before and after the compression test were mechanically polished and finished using a colloidal silica, and then the microstructure was observed using a Schottkey field emission scanning electron microscope (SEM, SU5000 Hitach High-Tech Corporation, Schaumburg, IL, USA) attached with electron back scatter diffraction (EBSD, TexSEM Laboratories, Inc., Draper, UT, USA).

Techniques:

Journal: Materials

Article Title: Deformation Texture of Bulk Cementite Investigated by Neutron Diffraction

doi: 10.3390/ma15134485

Figure Lengend Snippet: Pole figure maps of as-sintered sample obtained from neutron diffraction profiles.

Article Snippet: The bulk cementite samples before and after the compression test were mechanically polished and finished using a colloidal silica, and then the microstructure was observed using a Schottkey field emission scanning electron microscope (SEM, SU5000 Hitach High-Tech Corporation, Schaumburg, IL, USA) attached with electron back scatter diffraction (EBSD, TexSEM Laboratories, Inc., Draper, UT, USA).

Techniques:

Journal: Materials

Article Title: Deformation Texture of Bulk Cementite Investigated by Neutron Diffraction

doi: 10.3390/ma15134485

Figure Lengend Snippet: Pole figures of the compressed sample obtained by the neutron diffraction experiments.

Article Snippet: The bulk cementite samples before and after the compression test were mechanically polished and finished using a colloidal silica, and then the microstructure was observed using a Schottkey field emission scanning electron microscope (SEM, SU5000 Hitach High-Tech Corporation, Schaumburg, IL, USA) attached with electron back scatter diffraction (EBSD, TexSEM Laboratories, Inc., Draper, UT, USA).

Techniques:

Journal: IUCrJ

Article Title: Effect of annealing on the magnetic microstructure of high-pressure torsion iron: the relevance of higher-order contributions to the magnetic small-angle neutron scattering cross section

doi: 10.1107/S2052252523003937

Figure Lengend Snippet: Summary of the structural and magnetic parameters for HPT and non-deformed (nd) Fe determined by wide-angle XRD, EBSD and magnetometry

Article Snippet: The microstructure of the HPT and nd Fe samples was characterized by wide-angle X-ray diffraction (XRD) using a Bruker D8 DISCOVER diffractometer in Bragg–Brentano geometry (Cu K α radiation) and by electron backscattered diffraction (EBSD) using a Schottky field emission scanning electron microscope (SU5000, Hitachi High-Tech Corporation) with an electron backscatter detector (EDAX, Inc.).

Techniques: